The book "Рассеяние носителей тока в металлах и полупроводниках" (Scattering of carriers in metals and semiconductors) by [Author's name] is a comprehensive guide to understanding the fundamental principles of carrier scattering in various materials, including metals, semimetals, and semiconductors. The book provides a detailed analysis of the mechanisms of electron and hole scattering on phonons, impurities, dislocations, and surfaces, highlighting the importance of these processes in determining the electrical, thermal, and mechanical properties of materials. The author begins by introducing the concept of carrier scattering and its significance in modern technology, emphasizing the need for a deeper understanding of these mechanisms to develop new materials and technologies that can address the challenges facing humanity today. The book then delves into the specific scattering mechanisms in each type of material, using clear and concise language to explain complex concepts such as phonon-electron interactions, impurity scattering, and surface roughness effects. One of the key themes of the book is the evolution of technology and the need for a personal paradigm to perceive and understand the technological process of developing modern knowledge. The author argues that this paradigm shift is essential for the survival of humanity and the unification of people in a warring state. By studying and understanding the mechanisms of carrier scattering, readers will gain a deeper appreciation for the intricate relationships between materials, technology, and society, and be better equipped to navigate the rapidly changing world of modern technology. Throughout the book, the author uses numerous examples and illustrations to help readers visualize and comprehend the concepts being discussed. These include diagrams of crystal structures, graphs of scattering rates, and photographs of experimental setups, all of which serve to reinforce the text and make it more accessible to readers with varying levels of background knowledge.

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